Webinar: “Measurement of residual stresses by X-ray diffraction and FIB-DIC”

 Tuesday, May 21st, 2024

10:00h-11:00h

Online  

On May 21st, Ceit is organising the webinar ‘Measurement of residual stresses by X-ray diffraction and FIB’. This online event aims to address one of the critical but often underestimated aspects of industrial production: residual stresses. Residual stresses can have a significant impact on the efficiency of industrial processes and the integrity of final components. Understanding and controlling these stresses is therefore vital to improving the quality, durability and safety of parts. This webinar, aimed primarily at component manufacturers who, in their processing, employ techniques that can generate residual stresses (heat treatments, shot blasting techniques, machining, surface finishing, part joining, welding, layer deposition, additive manufacturing, etc.), will focus on two fundamental techniques for their measurement: X-ray diffraction and the FIB (Focused Ion Beam) technique. These techniques provide valuable information on the distribution and magnitude of residual stresses, allowing manufacturers to optimise their processes and guarantee the quality of their products.

Agenda