Advanced measurement
Description
Ceit has broad expertise in developing advanced instrumentation systems for monitoring systems, measuring critical parameters in production processes or existing products. These include methods based on:
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Electromagnetic field-based measurement
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Optical sensor-based measurement
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Ultrasound-based measurement
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Microwave-based measurement
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Advanced sensor development
These methods have direct application in Industry 4.0, intelligent transport systems and biomedical devices, among other areas. Having a battery of measurement methods available allows Ceit to undertake projects that develop advanced monitoring systems for various sectors.